Highly Accelerated Stress Test (HAST) System for Reliability

Procurement Summary

This is a CHIPS Metrology procurement supporting Project 3.08 for Grand Challenge 3, Enabling Metrology for Integrating Components in Advanced Packaging. The required HAST test system will significantly reduces the time required for humidity reliability testing, condensing weeks of conventional testing into hours or days. By simultaneously applying high temperature, high humidity, and high pressure, the HAST chamber accelerates moisture-induced failures. HAST will add new capability and productivity to produce defects in semiconductor packaging devices that will be used for defect characterization and failure analysis. The system, in support of NIST's mission, will be used for metrology development, including image acquisition, processing and optimization.

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