Advanced Semiconductor Test System/Probe Station
Waiver type - Procurement: Nonavailability
Agency: DEPT OF THE ARMY (2100) • Product Service Code (PSC) : 6640 | Last Modified: 08/30/2024
Procurement Summary
An Advanced Semiconductor Test System/Probe Station is necessary to test and characterize the electrical radio frequency capacity of devices produced by the Army Research Laboratory's (ARL) Diamond Electronics Technology development to determine if they can perform above standard voltage levels (exceeding 1500 Volts (V)) throughout the development process.
Waiver Rationale Summary
No other sources were found that can meet the Government's minimum requirements to test and characterize the capacity of devices produced by ARL's Diamond Electronics Technology development to determine if they can perform above standard voltage levels (exceeding 1500V) throughout the development process. While there are other probe stations in the marketplace, including those produced by FormFactor Inc. and SemiProbe, they do not have the special safety characteristics of MPI America's Advanced Semiconductor Testing system including Light curtain, mechanisms to prevent high voltage arcing, protection for other prober electronics, and an Anti-Arcing Liquid Tray.
Yes
No
Consistent with Policy
LABORATORY EQUIPMENT AND SUPPLIES
334515 - Instrument Manufacturing for Measuring and Testing Electricity and Electrical Signals
08/15/2024
W911QX24Q0262
W911QX24Q0262
Post-solicitation
Instant Delivery Only
Individual Waiver
DEPT OF THE ARMY